|
Microwave
Moisture Analyser Measurement advantages Vs near Infrared
Technology |
|
Potential
Limitation |
MOISTSCAN
® |
Near Infrared |
| Vertical segregation |
Unaffected - beam penetrates full
bed of material |
Reflectance technique from surface
molecules only. |
| Sample presentation |
Unaffected by position of material |
Distance of material surface to
receiver important |
| Colour |
Unaffected |
Significant effect |
| Ambient lighting |
Unaffected |
Requires shielding |
| Wear |
No moving parts |
Mechanical filter system |
| Presence of steam |
Unaffected |
Can cause interference |
| Dirty Atmosphere |
IP65 enclosures |
Window requires to be kept clean |
|
|
|
Microwave
Moisture Analyser Measurement advantages Vs Capacitance |
|
Potential
Limitation |
MOISTSCAN ® |
Capacitance |
| Vertical segregation |
Unaffected - beam penetrates full
bed of material |
Very limited material penetration,
possible vertical segregation effects |
| Sample presentation |
Unaffected by position of material |
requires control of distance of
conveyor belt to system |
| Conductivity of Material |
Wide range of materials amenable to
technique |
Limited range of applications |
| Steel cored reinforced conveyor
belts |
Can be used |
Cannot be used |